发明名称 |
Phase-change memory device, phase-change channel transistor, and memory cell array |
摘要 |
To reduce the voltage required to cause a phase transition from an amorphous phase to a crystalline phase, a phase-change memory device ( 1 ) comprises: a first electrode ( 6 ); a second electrode ( 8 ); and a memory layer ( 14 ) provided between the first ( 6 ) and second ( 8 ) electrodes, wherein the memory layer ( 14 ) includes at least a first layer ( 10 ) formed from a phase-change material which is stable in either the amorphous phase or the crystalline phase at room temperature, and a second layer ( 12 ) formed from a resistive material, and wherein the resistance value of the second layer ( 12 ) is smaller than the resistance value of the first layer ( 10 ) in the amorphous phase, but is larger than the resistance value of the first layer ( 10 ) in the crystalline phase.
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申请公布号 |
US2008049490(A1) |
申请公布日期 |
2008.02.28 |
申请号 |
US20070882582 |
申请日期 |
2007.08.02 |
申请人 |
SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER |
发明人 |
HOSAKA SUMIO;SONE HAYATO;YOSHIMARU MASAKI;ONO TAKASHI;NAKASATO MAYUMI |
分类号 |
G11C11/00 |
主分类号 |
G11C11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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