PLANE DISTORTION MEASURING DEVICE AND METHOD

摘要

There are provided a plane distortion measuring device and method capable of quantitatively, rapidly, and accurately measuring and evaluating plane distortion distribution at all the observable points on a surface of a mirror-shaped or half-mirror-shaped measurement object. The device includes: pattern display means (2) capable of switching between a plurality of light and dark patterns (5) for display; imaging means (3) for imaging a mirror image of the light and dark patters displayed on the pattern display means which are taken on the surface of the mirror-shaped or half-mirror-shaped measurement object (1); and plane distortion distribution calculation means (10) for processing the mirror image of the imaged light and dark patterns calculating the plane distortion distribution on the surface of the measurement object.