| 摘要 |
The invention relates to a shape measuring device and method, and a program therefor, that allow measuring the shape of a test object, more simply and reliably, using a single-chip color sensor. An optical low-pass filter (24) expands a slit beam reflected on a test object (12), in a direction perpendicular to a baseline direction. A CCD sensor (25) has R, G and B pixels arranged in a Bayer array, and the CCD sensor (25) outputs image signals that are obtained by the pixels receiving the slit beam. On the basis of image signals of the G pixels, an image processing unit (26) detects the timing at which the slit beam passes over a site of the test object (12) that is pre-set for the G pixels and, on the basis of image signals of the R pixels and the B pixels, controls a projection unit (22) to adjust the intensity of the slit beam. A dot group computing unit (27) computes the position of the test object (12) on the basis of the timing detected for the G pixels. The invention can be used in a three-dimensional shape measuring device. |
