发明名称 REFLECTIVE MASK AND PROCESS OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a reflective mask capable of suppressing a size change accompanying a focus change.SOLUTION: A reflective mask 10 includes: a substrate 11; a multilayer reflection film 12 formed on the substrate 11; an absorption pattern 21A formed on the multilayer reflection film 12; and a recess 13 formed on the multilayer reflection film 12 in a peripheral area of the absorption pattern 21A.
申请公布号 JP2014096397(A) 申请公布日期 2014.05.22
申请号 JP20120245267 申请日期 2012.11.07
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 KAGAWA TAKESHI
分类号 H01L21/027;G03F1/24 主分类号 H01L21/027
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