发明名称 System-on-chip (SOC) solutions with multiple devices by multiple poly gate trimming process
摘要 A method of forming gate electrode layer portions having differing widths comprising the following steps. A structure having a gate electrode layer and a hard mask layer thereover and including two or more active areas is provided. The hard mask layer is patterned to form two or more respective hard mask layer portions within the two or more active areas. One or more of the two or more respective hard mask layer portions is/are selectively trimmed to reduce its/their width to a second width leaving at least one the respective hard mask layer portions untrimmed. The gate electrode layer is then patterned.
申请公布号 US2004185623(A1) 申请公布日期 2004.09.23
申请号 US20030392120 申请日期 2003.03.19
申请人 TAIWAN SEMICONDUCTOR MANAUFACTURING CO. 发明人 SU HUNG-DER;WU SHIEN-YANG;CHEN YUNG-SHUN;SHIE TUNG-HENG;CHIU YUAN-HUNG
分类号 H01L21/28;H01L21/3213;H01L21/8234;(IPC1-7):H01L21/338;H01L21/320;H01L21/476;H01L21/823 主分类号 H01L21/28
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