发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>A method for manufacturing a semiconductor device is provided to prevent a bending effect of a gate due to a counter doping photoresist pattern by performing a counter doping process before forming the gate. A semiconductor substrate(21) including an isolation layer for defining an active region is provided. A gate region of the active region is recessed. An ion implantation mask is formed on the entire surface of the substrate. A first conductive type impurity ions are implanted into the exposed region of the substrate. The ion implantation mask is removed therefrom. A gate is formed on the recessed part of the substrate. An asymmetric junction region is formed within the surface of the substrate of both sides of the gate by implanting a second conductive type impurity ion therein.</p>
申请公布号 KR20070000710(A) 申请公布日期 2007.01.03
申请号 KR20050056275 申请日期 2005.06.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 OH, JAE GEUN;KIM, YONG SOO;JANG, SE AUG;HWANG, SUN HWAN
分类号 H01L29/78 主分类号 H01L29/78
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