发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing a semiconductor device is provided to prevent a bending effect of a gate due to a counter doping photoresist pattern by performing a counter doping process before forming the gate. A semiconductor substrate(21) including an isolation layer for defining an active region is provided. A gate region of the active region is recessed. An ion implantation mask is formed on the entire surface of the substrate. A first conductive type impurity ions are implanted into the exposed region of the substrate. The ion implantation mask is removed therefrom. A gate is formed on the recessed part of the substrate. An asymmetric junction region is formed within the surface of the substrate of both sides of the gate by implanting a second conductive type impurity ion therein.</p> |
申请公布号 |
KR20070000710(A) |
申请公布日期 |
2007.01.03 |
申请号 |
KR20050056275 |
申请日期 |
2005.06.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
OH, JAE GEUN;KIM, YONG SOO;JANG, SE AUG;HWANG, SUN HWAN |
分类号 |
H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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