发明名称 |
SEMICONDUCTOR TEST DEVICE |
摘要 |
<p>It is possible to provide a semiconductor test device capable improving the test efficiency. The semiconductor test device includes: a driver (14) which generates a driver signal for outputting a driver signal to a device under test; a variable delay circuit (12) provided at the preceding stage of the driver (14); a register (16) for setting an output level of a driver signal outputted from the driver (14); a correction value memory (26) which outputs correction data corresponding to a shift of the rise timing or the fall timing of the driver signal when the output level is modified from a predetermined value serving as a reference value of the output level; an amplitude correction value register (28) which sets a delay amount by a variable delay circuit (12) by considering correction data which is outputted from the correction value memory (26); an adder circuit (30).</p> |
申请公布号 |
WO2008044464(A1) |
申请公布日期 |
2008.04.17 |
申请号 |
WO2007JP68530 |
申请日期 |
2007.09.25 |
申请人 |
IBANE, TORU;ADVANTEST CORPORATION |
发明人 |
IBANE, TORU |
分类号 |
G01R31/3183 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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