发明名称 |
PROCEDE DE CARACTERISATION DE LA SENSIBILITE D'UN COMPOSANT ELECTRONIQUE SOUMIS A DES CONDITIONS D'IRRADIATION |
摘要 |
A method of selecting a piece of electronic equipment subjected to irradiation conditions comprising at least one electronic component by characterizing a sensitivity parameter of the electronic component to the irradiation conditions listed in a predetermined specifications. The electronic component is irradiated with a source of ionizing radiation having the known irradiation characteristics and geometry. A set of operating values of the electronic component are measured during the irradiation of the electronic component. The sensitivity of the electronic component are measured for a number of irradiation conditions lower than all of the conditions listed in the specifications. The measured results are extrapolated to the other irradiation conditions of the specifications. |
申请公布号 |
FR2979708(B1) |
申请公布日期 |
2014.06.06 |
申请号 |
FR20110057892 |
申请日期 |
2011.09.06 |
申请人 |
EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY EADS FRANCE |
发明人 |
MILLER FLORENT;WEULERSSE CECILE |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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