发明名称 バイポーラ・パンチ・スルー半導体デバイス及びそのような半導体デバイスを製造するための方法
摘要 A bipolar diode (1) is provided having a drift layer (2) of a first conductivity type on a cathode side (13) and an anode layer (3) of a second conductivity type on an anode side (14). The anode layer (3) comprises a diffused anode contact layer (5) and a double diffused anode buffer layer (4). The anode contact layer (5) is arranged up to a depth of at most 5 µm and the anode buffer layer (4) is arranged up to a depth of 18 to 25 µm. The anode buffer layer (4) has a doping concentration between 8.0*10 15 and 2.0 * 10 16 cm -3 in a depth of 5 µm and between 1.0*10 14 up to 5.0 * 10 14 cm -3 in a depth of 15 µm, resulting in good softness of the device and low leakage current. Prior art diodes have either over all depths lower doping concentrations resulting in high leakage current or enhanced doping concentration resulting in bad softness.
申请公布号 JP5992216(B2) 申请公布日期 2016.09.14
申请号 JP20120134819 申请日期 2012.06.14
申请人 アーベーベー・テヒノロギー・アーゲー 发明人 シュフェン・マッティアス
分类号 H01L21/329;H01L21/265;H01L29/861;H01L29/868 主分类号 H01L21/329
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