发明名称 |
PLASMA ETCHING APPARATUS, PLASMA ETCHING SYSTEM AND METHOD OF ETCHING A SUBSTRATE USING THE SAME |
摘要 |
A plasma etching apparatus, a plasma etching system, and a substrate etching method are provided to quickly remove pollutants from a substrate by performing etching processes on upper, side, lower, and rear surfaces of the substrate at the same time. A plasma etching apparatus includes a first etching module(21), a second etching module(22), and a transfer module(35). The first etching module etches a periphery of a substrate. The second etching module is arranged to be close to a first process module and etches a rear surface of the substrate. The transfer module transfers the substrate in and out of the first and second etching modules. The transfer module includes a main body and a blade. The blade is rotatably connected to the main body and inverts the substrate. The substrate is temporarily contained in a load-lock chamber. The transfer module is arranged in a transfer chamber.
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申请公布号 |
KR20080082252(A) |
申请公布日期 |
2008.09.11 |
申请号 |
KR20070022855 |
申请日期 |
2007.03.08 |
申请人 |
SOSUL CO., LTD.;KOMICO LTD. |
发明人 |
KIM, GEUN HO;LEE, JUNG HEE;JEON, SUN Q |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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