| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe for a magnetic force microscope capable of observing a magnetic domain structure without causing the invasion problem of local magnetism even in the magnetic domain structure of a nanometer size. SOLUTION: In the probe 10 for the magnetic force microscope having a magnetic region at its pointed end part 12 and detecting the magnetic force caused by allowing the magnetic region to approach the surface of a sample, the magnetic region of the pointed end part 12 of the probe 10 is formed of a dia-ferromagnetic single crystal to micronize the self-magnetic field leaked from the magnetic region. COPYRIGHT: (C)2007,JPO&INPIT
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