Method for testing semiconductor components, especially fast memory chips, accurately determines rising or falling flanks in a test signal to measure phase differences relative to a synchronizing clock signal

摘要

To test a component the phase difference between points where the data signal changes value and corresponding synchronizing clock signal changes are measured. Multi-phase strobe impulses are produced that have negligible phase difference between each other relative to the clock signal. The clock signal is sampled using the multi-phase strobe signal and phase differences measured. If the phase difference between the data signal and the clock signal is within a predetermined level then the component is acceptable. An Independent claim is made for a device for testing semiconductor components.