| 发明名称 |
APPARATUS AND METHOD FOR CONTROLLING THE RELIABILITY STRESS RATE ON A PROCESSOR |
| 摘要 |
An apparatus and method for tracking stress on a processor and responsively controlling operating conditions. For example, one embodiment of a processor comprises: stress tracking logic to determine stress experienced by one or more portions of the processor based on current operating conditions of the one or more portions of the processor; and stress control logic to control one or more operating characteristics of the processor based on the determined stress and a target stress accumulation rate. |
| 申请公布号 |
US2015006971(A1) |
申请公布日期 |
2015.01.01 |
| 申请号 |
US201313931115 |
申请日期 |
2013.06.28 |
| 申请人 |
Shapira Dorit;Sistla Krishnakanth V.;Rotem Efraim;Shulman Nadav;Zobel Shmulik;Chu Allen |
发明人 |
Shapira Dorit;Sistla Krishnakanth V.;Rotem Efraim;Shulman Nadav;Zobel Shmulik;Chu Allen |
| 分类号 |
G06F11/30;G06F1/28 |
主分类号 |
G06F11/30 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A processor comprising:
stress tracking logic to determine stress experienced by one or more portions of the processor based on current operating conditions of the one or more portions of the processor; and stress control logic to control one or more operating characteristics of the processor based on the determined stress and a target stress accumulation rate. |
| 地址 |
Atlit IL |
