发明名称 Radiation source, lithographic apparatus, and device manufacturing method
摘要 <p>A radiation source (SO) is configured to generate extreme ultraviolet radiation (T). The radiation source includes a laser (30) constructed and arranged to generate a beam of radiation (32) directed to a plasma generation site (12,112) where a plasma is generated when the beam of radiation interacts with a fuel, an optical component (10,110,50) having a surface (11,56) that is arranged and positioned to be hit by a droplet (42) of fuel, and a temperature conditioner (54) constructed and arranged to elevate the temperature of the surface. A coating (52) may be provided on the surface that alters at least one property of the surface. An energy source (70) may be constructed and arranged (60,72) to prevent the droplet of fuel from solidifying or to evaporate the droplet of fuel before the droplet of fuel hits the surface.</p>
申请公布号 EP2157481(A2) 申请公布日期 2010.02.24
申请号 EP20090166136 申请日期 2009.07.22
申请人 ASML NETHERLANDS B.V. 发明人 SCHIMMEL, HENDRIKUS;BANINE, VADIM;LOOPSTRA, ERIK;BOSSCHAART, KAREL JOOP
分类号 G03F7/20;G21K1/06;H05G2/00 主分类号 G03F7/20
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