发明名称 RESIDUAL DC VOLTAGE EVALUATING METHOD AND EVALUATION DEVICE THEREFOR
摘要 <p>A residual DC voltage evaluating method for evaluating residual DC voltage produced in a liquid crystal cell comprising a liquid crystal held between oriented films, in which a plurality of sets of a combination of voltage applying time t during which a voltage is applied to the liquid crystal cell externally with a residual DC voltage V&lt;SUB&gt;rDC&lt;/SUB&gt; produced by applying a voltage during the voltage applying time t are measured, and the measurements plotted at a plurality of points as reference signs (30) are curve-fitted using the expression 1. [Expression 1] V&lt;SUB&gt;rDC&lt;/SUB&gt;(t) = {q/C&lt;SUB&gt;LC&lt;/SUB&gt;}{k&lt;SUB&gt;a&lt;/SUB&gt;n&lt;SUB&gt;f&lt;/SUB&gt; /(k&lt;SUB&gt;a&lt;/SUB&gt;n&lt;SUB&gt;f &lt;/SUB&gt;+ k&lt;SUB&gt;d&lt;/SUB&gt;)}N[1-exp{-(k&lt;SUB&gt;a&lt;/SUB&gt;n&lt;SUB&gt;f&lt;/SUB&gt; + k&lt;SUB&gt;d&lt;/SUB&gt;)t}] Accordingly, a residual DC voltage evaluating method is provided which can compare between materials by obtaining parameters specific to liquid crystal materials and oriented film materials.</p>
申请公布号 WO2007141935(A1) 申请公布日期 2007.12.13
申请号 WO2007JP53288 申请日期 2007.02.22
申请人 SHARP KABUSHIKI KAISHA;TOHOKU UNIVERSITY;MIZUSAKI, MASANOBU;UCHIDA, TATSUO 发明人 MIZUSAKI, MASANOBU;UCHIDA, TATSUO
分类号 G02F1/1337;G02F1/13;G02F1/133 主分类号 G02F1/1337
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