发明名称 |
RESIDUAL DC VOLTAGE EVALUATING METHOD AND EVALUATION DEVICE THEREFOR |
摘要 |
<p>A residual DC voltage evaluating method for evaluating residual DC voltage produced in a liquid crystal cell comprising a liquid crystal held between oriented films, in which a plurality of sets of a combination of voltage applying time t during which a voltage is applied to the liquid crystal cell externally with a residual DC voltage V<SUB>rDC</SUB> produced by applying a voltage during the voltage applying time t are measured, and the measurements plotted at a plurality of points as reference signs (30) are curve-fitted using the expression 1. [Expression 1] V<SUB>rDC</SUB>(t) = {q/C<SUB>LC</SUB>}{k<SUB>a</SUB>n<SUB>f</SUB> /(k<SUB>a</SUB>n<SUB>f </SUB>+ k<SUB>d</SUB>)}N[1-exp{-(k<SUB>a</SUB>n<SUB>f</SUB> + k<SUB>d</SUB>)t}] Accordingly, a residual DC voltage evaluating method is provided which can compare between materials by obtaining parameters specific to liquid crystal materials and oriented film materials.</p> |
申请公布号 |
WO2007141935(A1) |
申请公布日期 |
2007.12.13 |
申请号 |
WO2007JP53288 |
申请日期 |
2007.02.22 |
申请人 |
SHARP KABUSHIKI KAISHA;TOHOKU UNIVERSITY;MIZUSAKI, MASANOBU;UCHIDA, TATSUO |
发明人 |
MIZUSAKI, MASANOBU;UCHIDA, TATSUO |
分类号 |
G02F1/1337;G02F1/13;G02F1/133 |
主分类号 |
G02F1/1337 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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