INSERTING BYPASS STRUCTURES AT TAP POINTS TO REDUCE LATCH DEPENDENCY DURING SCAN TESTING

摘要

A method and apparatus are provided to test an integrated circuit by identifying first and second components of an integrated circuit. The first and second components may share a relationship that causes the first and second components to generate a matching binary output in response to an input to the integrated circuit. A tap point may be selected within the integrated circuit. The tap point may be located at a point in the integrated circuit where an insertion of a bypass structure would affect the relationship. The bypass structure may be inserted at the tap point, and the bypass structure may be used to conduct a test of the integrated circuit.

主权项

1. An apparatus comprising:
a first component of an integrated circuit; a second component of the integrated circuit, wherein the first and second components share a relationship that causes the first and second components to generate a matching binary output in response to an input to the integrated circuit; a bypass structure; and a processor configured to execute program code to:
identify the first and second components of the integrated circuit;select a tap point within the integrated circuit, wherein the tap point is located at a point in the integrated circuit where an insertion of the bypass structure would affect the relationship; andto insert the bypass structure at the tap point.