发明名称 Abnormality Diagnosis Method and Device Therefor
摘要 In industrial machine abnormality diagnosis, if the machine is diagnosed to have abnormality, then sensor data from the machine needs to be sent to a management center for causal analysis. However, since machines operated at a remote site cannot always communicate with a management center, it has been found that, in some cases, sensor data that has failed to be sent from a machine remains in the memory of the machine, resulting in lack of available memory capacity. In view of this, the present invention determines beforehand whether the diagnosed machine will run out of available memory capacity before the completion of sending the amount of sensor data required for causal analysis for the machine, and instructs a maintenance person to recover memory. This determination as to whether the machine will run out of available memory capacity before the completion of sending the amount of sensor data required for the causal analysis for the machine, is made as follows: (1) first, the machine predicts the run-out date on which the machine will run out of memory capacity for storing sensor data generated in the machine, and sends a notification of the predicted run-out date to the management center for the machine; and (2) next, from the amount of sensor data required for the causal analysis and the reception rate of sensor data, the management center calculates the number of days required to retrieve the necessary data for the causal analysis and determines whether the management center can retrieve the data by the predicted run-out date.
申请公布号 US2016209838(A1) 申请公布日期 2016.07.21
申请号 US201314914381 申请日期 2013.09.13
申请人 Hitachi, Ltd. 发明人 UCHIDA Takayuki;SUZUKI Hideaki;FUJIWARA Junsuke;HIRUTA Tomoaki;UNUMA Munetoshi
分类号 G05B23/02 主分类号 G05B23/02
代理机构 代理人
主权项 1. An abnormality diagnosis device comprising: an abnormality diagnosis unit which carries out abnormality diagnosis on the basis of sensor data measured by sensors attached to each part of a machine; a storage unit which, if an abnormality is found, stores the sensor data thereof; an abnormality diagnosis data gathering unit which sends abnormality diagnosis data to a data center using communication; and a unit which predicts an available capacity run-out date on which a storage device of the machine runs out of remaining available capacity when the communication state is not good and not all unsent sensor data can be sent to the data center.
地址 Chiyoda-ku, Tokyo JP