METHOD AND SYSTEM FOR DIGITAL CIRCUIT SCAN TESTING

摘要

Embodiments of methods and systems for digital circuit scan testing are described. In one embodiment, a method for scan testing a digital circuit involves testing a digital circuit using a scan chain to generate scan data and distributing the scan data over a plurality of scan output terminals using a sample and hold device

主权项

1. A method for digital circuit scan testing, the method comprising:
testing a digital circuit using a scan chain to generate scan data at a frequency of a test clock signal; dividing the frequency of the test clock signal to generate a sample clock signal; and distributing the scan data over a plurality of scan output terminals using a sample and hold device, wherein the scan data is received at an input of the sample and hold device at the frequency of the test clock signal, and wherein distributing the scan data over the scan output terminals comprises outputting the scan data through the scan output terminals at a frequency of the sample clock signal.