| 摘要 |
Self-test circuitry for testing a circuit interrupter includes an active element coupled to an operating mechanism, a first sub-circuit for temporarily disabling the active element, a second sub-circuit structured to generate a simulated ground fault condition, and a processing unit coupled to the ground fault detection circuitry. The first sub-circuit and the second sub-circuit, the processing unit being structured and configured to control the first sub-circuit to temporarily disable the active element and to control the second sub-circuit to generate the simulated ground fault condition when the active element is disabled. Also, self-test circuitry that includes a sub-circuit structured to generate a simulated ground fault condition and a processing unit structured and configured to control the sub-circuit to generate the simulated ground fault condition only during a predetermined portion of a half cycle of energy passing through the circuit interrupter. |
