发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To improve a deposition rate of a boron-nitride film containing a borazine ring skeleton.SOLUTION: The manufacturing method of a semiconductor device includes a step of forming a film on a substrate, having a borazine ring skeleton, containing boron and nitrogen by intermittently and simultaneously performing a step of providing the substrate with borazine gas containing a ligand and a step of providing the substrate with a ligand desorption gas for desorbing the ligand under a condition in which the borazine skeleton of the borazine gas is kept.SELECTED DRAWING: Figure 4
申请公布号 JP2016063007(A) 申请公布日期 2016.04.25
申请号 JP20140188429 申请日期 2014.09.17
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HARADA KATSUYOSHI;HIROSE YOSHIRO;SANO ATSUSHI
分类号 H01L21/318;C23C16/38;C23C16/455;H01L21/31 主分类号 H01L21/318
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