发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To improve a deposition rate of a boron-nitride film containing a borazine ring skeleton.SOLUTION: The manufacturing method of a semiconductor device includes a step of forming a film on a substrate, having a borazine ring skeleton, containing boron and nitrogen by intermittently and simultaneously performing a step of providing the substrate with borazine gas containing a ligand and a step of providing the substrate with a ligand desorption gas for desorbing the ligand under a condition in which the borazine skeleton of the borazine gas is kept.SELECTED DRAWING: Figure 4 |
申请公布号 |
JP2016063007(A) |
申请公布日期 |
2016.04.25 |
申请号 |
JP20140188429 |
申请日期 |
2014.09.17 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
HARADA KATSUYOSHI;HIROSE YOSHIRO;SANO ATSUSHI |
分类号 |
H01L21/318;C23C16/38;C23C16/455;H01L21/31 |
主分类号 |
H01L21/318 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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