| 发明名称 |
INTEGRATED COMPUTATIONAL ELEMENT WITH MULTIPLE FREQUENCY SELECTIVE SURFACES |
| 摘要 |
An optical analysis tool includes an integrated computational element (ICE). The ICE includes a plurality of layers stacked along a first axis. Constitutive materials of the layers are electrically conductive and patterned with corresponding patterns. An arrangement of the patterns with respect to each other is related to a characteristic of a sample. |
| 申请公布号 |
US2016265352(A1) |
申请公布日期 |
2016.09.15 |
| 申请号 |
US201414762194 |
申请日期 |
2014.06.13 |
| 申请人 |
HALLIBURTON ENERGY SERVICES, INC. |
发明人 |
Gao Li;Pelletier Michael T.;Perkins David L. |
| 分类号 |
E21B49/08;H05K1/02;H05K1/09;G01N21/31;H05K3/12 |
主分类号 |
E21B49/08 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measurement tool for measuring a characteristic of a sample, the measurement tool comprising:
an integrated computational element (ICE) comprising a plurality of layers stacked along a first axis, a constitutive material of each of the layers being electrically conductive and patterned with a corresponding pattern, wherein an arrangement of the patterns with respect to each other is related to a characteristic of a sample. |
| 地址 |
Houston TX US |
