发明名称 UPPER DOME TEMPERATURE CLOSED LOOP CONTROL
摘要 A method and apparatus for controlling the temperature in a processing chamber for semiconductor processing is disclosed herein. In one embodiment, a processing chamber for semiconductor processing is provided. The processing chamber includes a chamber body and a temperature control system. The temperature control system includes a temperature sensor configured to measure a temperature in an upper dome of the processing chamber, a blower, and a controller configured to control the temperature control system. The temperature control system is configured to carry out the method provided herein for controlling the temperature in a processing chamber.
申请公布号 US2016282886(A1) 申请公布日期 2016.09.29
申请号 US201514722327 申请日期 2015.05.27
申请人 Applied Materials, Inc. 发明人 LEIGHTON Jamie Stuart;CABALLERO Carlos;KITAMURA Shin;ACKERMAN Thomas;AUZENNE Mark;VINIT Vivek
分类号 G05D23/19;G05B11/42 主分类号 G05D23/19
代理机构 代理人
主权项 1. A processing chamber for semiconductor processing, the processing chamber comprising: a chamber body comprising: an upper dome;a lower dome, the upper dome and the lower dome defining an interior volume of the processing chamber; and a temperature control system comprising: a temperature sensor to measure a temperature of the upper dome;a blower; anda controller in communication with the blower and the temperature sensor.
地址 Santa Clara CA US