发明名称 |
UPPER DOME TEMPERATURE CLOSED LOOP CONTROL |
摘要 |
A method and apparatus for controlling the temperature in a processing chamber for semiconductor processing is disclosed herein. In one embodiment, a processing chamber for semiconductor processing is provided. The processing chamber includes a chamber body and a temperature control system. The temperature control system includes a temperature sensor configured to measure a temperature in an upper dome of the processing chamber, a blower, and a controller configured to control the temperature control system. The temperature control system is configured to carry out the method provided herein for controlling the temperature in a processing chamber. |
申请公布号 |
US2016282886(A1) |
申请公布日期 |
2016.09.29 |
申请号 |
US201514722327 |
申请日期 |
2015.05.27 |
申请人 |
Applied Materials, Inc. |
发明人 |
LEIGHTON Jamie Stuart;CABALLERO Carlos;KITAMURA Shin;ACKERMAN Thomas;AUZENNE Mark;VINIT Vivek |
分类号 |
G05D23/19;G05B11/42 |
主分类号 |
G05D23/19 |
代理机构 |
|
代理人 |
|
主权项 |
1. A processing chamber for semiconductor processing, the processing chamber comprising:
a chamber body comprising:
an upper dome;a lower dome, the upper dome and the lower dome defining an interior volume of the processing chamber; and a temperature control system comprising:
a temperature sensor to measure a temperature of the upper dome;a blower; anda controller in communication with the blower and the temperature sensor. |
地址 |
Santa Clara CA US |