发明名称 |
Semiconductor Device Having Wafer Level Chip Scale Packaging Substrate Decoupling |
摘要 |
One aspect of the invention provides a semiconductor device that includes a microchip having an outermost surface. First and second bond pads are located on the microchip and near the outermost surface. A first UBM contact is located on the outermost surface and between the first and second bond pads. The first UBM contact is offset from the first bond pad. A second UBM contact is located on the outermost surface and between the first and second bond pads. The second UBM contact is offset from the second bond pad, and a capacitor supported by the microchip is located between the first and second UBM contacts.
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申请公布号 |
US2009057889(A1) |
申请公布日期 |
2009.03.05 |
申请号 |
US20080048294 |
申请日期 |
2008.03.14 |
申请人 |
TEXAS INSTRUMENTS INC. |
发明人 |
MURUGAN RAJEN M.;MCCARTHY ROBERT F.;HAROUN BAHER S.;HARPER PETER R. |
分类号 |
H01L23/48;H01L21/20;H01L21/44 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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