发明名称 Semiconductor Device Having Wafer Level Chip Scale Packaging Substrate Decoupling
摘要 One aspect of the invention provides a semiconductor device that includes a microchip having an outermost surface. First and second bond pads are located on the microchip and near the outermost surface. A first UBM contact is located on the outermost surface and between the first and second bond pads. The first UBM contact is offset from the first bond pad. A second UBM contact is located on the outermost surface and between the first and second bond pads. The second UBM contact is offset from the second bond pad, and a capacitor supported by the microchip is located between the first and second UBM contacts.
申请公布号 US2009057889(A1) 申请公布日期 2009.03.05
申请号 US20080048294 申请日期 2008.03.14
申请人 TEXAS INSTRUMENTS INC. 发明人 MURUGAN RAJEN M.;MCCARTHY ROBERT F.;HAROUN BAHER S.;HARPER PETER R.
分类号 H01L23/48;H01L21/20;H01L21/44 主分类号 H01L23/48
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