| 发明名称 |
STRUCTURE FOR OPTICAL ANALYSIS AND INK COMPOSITION FOR MANUFACTURING THE SAME |
| 摘要 |
Disclosed herein are a structure for optical analysis that is capable of optically analyzing a small amount of a sample and an ink composition for manufacturing the same. A structure for optical analysis includes a support and an ink structure coupled to the support and configured to form a chamber on one surface of the support. The ink structure includes a first ink structural component configured to form a body of the ink structure and a second ink structural component formed at a lower portion of a side surface of the first ink, such that the first ink structural component and the second ink structural component have different slopes with respect to a direction of a center of the chamber. |
| 申请公布号 |
US2016168398(A1) |
申请公布日期 |
2016.06.16 |
| 申请号 |
US201514753378 |
申请日期 |
2015.06.29 |
| 申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO Euy Hyun;KANG Ji Yun;KIM Ji Won;PARK Sung Ha;LEE Beom Seok |
| 分类号 |
C09D11/00;G01N21/59;G01N21/01 |
主分类号 |
C09D11/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A structure for optical analysis, comprising:
a support; and an ink structure coupled to the support and configured to form a chamber on one surface of the support, wherein the ink structure comprises: a first ink structural component configured to form a body of the ink structure and having a first slope with respect to a direction of a center of the chamber; and a second ink structural component formed at a lower portion of a side surface of the first ink structure and having a second slope with respect to the direction of the center of the chamber, wherein the first slope is different from the second slope. |
| 地址 |
Suwon-si KR |
