发明名称 |
DEVICE AND METHOD FOR TESTING ELECTRONIC COMPONENTS |
摘要 |
The invention relates to a device for testing electronic components, comprising: a testing head, and means for bringing the components for testing into contact with the testing head, characterized in that the means for bringing the components for testing into contact with the testing head comprise at least two positioning units which are adapted for co-action with the common testing head. The invention also relates to a method for performing a test measurement.
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申请公布号 |
WO02056037(A1) |
申请公布日期 |
2002.07.18 |
申请号 |
WO2002NL00029 |
申请日期 |
2002.01.16 |
申请人 |
FICO B.V.;POTHOVEN, ANTOON, WILLEM |
发明人 |
POTHOVEN, ANTOON, WILLEM |
分类号 |
G01R31/26;G01R31/00;G01R31/01;G01R31/316;(IPC1-7):G01R31/01 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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