发明名称 INSPECTION DEVICE FOR DISPLAY DEVICE AND INSPECTION METHOD OF THE SAME
摘要 An inspection device for display devices and an inspection method of the same are provided to connect soft circuit films with inspection substrates electrically and to inspect inspection signals in driving chips through a signal inspection part for inspecting the connected state of the display panels and the soft circuit films, thereby obtaining the reliability of the aging test. An inspection device(100) for display devices(10) comprises inspection substrates(300) and a power supplier(400). The inspection substrates, connected with soft circuit films(30) connected with display panels(20) of the display devices, output inspection signals of inspecting the connected state of the display panels and the soft circuit films. The power supplier, connected with the inspection substrates electrically, supplies the driving power to the display panel. The display devices have driving chips(40) with signal inspection parts(42). Thereby, the connected state of the display panels and the soft circuit films is easily inspected.
申请公布号 KR20080033564(A) 申请公布日期 2008.04.17
申请号 KR20060099117 申请日期 2006.10.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 OH, SE CHUN;YOO, JONG KUN
分类号 G02F1/13 主分类号 G02F1/13
代理机构 代理人
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