发明名称 |
X-Ray Imaging System And Method |
摘要 |
An X-ray imaging system can include an X-ray source that projects a beam of X-ray radiation and an X-ray detector positioned to receive the beam of X-ray radiation at a location. The X-ray detector can include: (i) a monolithic substrate having a first side and a second side opposite the first side, (ii) a scintillation layer arranged upon the first side and including a first region and a second region, the first region having a first X-ray sensitivity and the second region having a second X-ray sensitivity different than the first X-ray sensitivity, and (iii) a photosensor array arranged upon the second side. The X-ray source and X-ray detector can be configured to adjust the location at which the X-ray detector receives the beam of X-ray radiation such that the location is primarily within the first region or the second region. |
申请公布号 |
US2016341831(A1) |
申请公布日期 |
2016.11.24 |
申请号 |
US201615230720 |
申请日期 |
2016.08.08 |
申请人 |
MEDTRONIC NAVIGATION, INC. |
发明人 |
HELM PATRICK A.;SHI SHUANGHE |
分类号 |
G01T1/20;A61B6/00 |
主分类号 |
G01T1/20 |
代理机构 |
|
代理人 |
|
主权项 |
1. An X-ray imaging system, comprising:
an X-ray source configured to project a beam of radiation toward an object; a first filter arranged at the X-ray source to filter the beam of radiation prior to being received at a first region; a second filter arranged at the X-ray source to filter the beam of radiation prior to being received at a second region; and an X-ray detector positioned to receive the beam of radiation, the X-ray detector including:
a substrate having a first side and a second side,a scintillation layer on the first side of the substrate, the scintillation layer having the first region with a first X-ray sensitivity and the second region with a second X-ray sensitivity different than the first X-ray sensitivity, anda photosensor array on the second side of the substrate, the photosensor array having a first photosensor subarray that corresponds to the first region and a second photosensor subarray that corresponds to the second region, wherein the X-ray source and the X-ray detector are configured to adjust a location at which the X-ray detector receives the beam of radiation such that the location is at least partially within the first region or the second region. |
地址 |
LOUISVILLE CO US |