Read amplifier for detecting condition of e.g. flash memory cell, has reference current source to provide reference current to input of amplifier, and clocked control flip-flop for controlling source as reaction of control clock signal

摘要

The amplifier has a reference current source (100) to provide a reference current to an input of the read amplifier. The current source has a reference transistor with a source, a drain and a gate in a preset state. A clocked control flip-flop is provided for controlling the current source as reaction of a control clock signal. A clocked collecting flip-flop is provided for selecting the current supplied to the input as reaction of a collecting clock signal. An independent claim is also included for a method for testing a speed of a read amplifier.