发明名称 プロセス評価用半導体集積回路
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit for process evaluation in which the information, becoming a determination material for subtle process control, can be collected in a short time.SOLUTION: A mask ROM, as a semiconductor integrated circuit for process evaluation, has a row decoder giving a row selection voltage, for activating a transistor constituting a memory cell to be read, when reading data therefrom, a sense amplifier for determining the data read out from the memory cell by comparing a current flowing through the memory cell with a reference current. The mask ROM is further provided with means 200a for switching the row selection voltage and means for switching the reference current.
申请公布号 JP6011651(B2) 申请公布日期 2016.10.19
申请号 JP20150016509 申请日期 2015.01.30
申请人 凸版印刷株式会社 发明人 浅野 正通
分类号 H01L21/66;G11C16/02;G11C16/06;G11C17/18;G11C29/12 主分类号 H01L21/66
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