发明名称 SAMPLE FOR ELECTRON MICROSCOPE AND PREPARATION METHOD FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To produce a sample with desired thickness for an electron microscope irrespective of type or structure of a sample source.SOLUTION: A sample 1p for electron microscopes includes: a tapering shape part 111p having a base end and a tip smaller in thickness than the base end; and a thick part 112p which is provided in a tip 111pof the tapering shape part, and is thickly formed compared with the thickness of the tip.SELECTED DRAWING: Figure 20
申请公布号 JP2016218040(A) 申请公布日期 2016.12.22
申请号 JP20150243472 申请日期 2015.12.14
申请人 FUJI ELECTRIC CO LTD 发明人 TERANISHI HIDEAKI
分类号 G01N1/28 主分类号 G01N1/28
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