发明名称 Halbleiterbaustein für eine Burn-In-Testanordnung
摘要 The component (5) can be connected to a burn-in voltage, which is higher than its internal voltage, which is impressed across a switchable regulator (6) integrated in the component. An element (1,2) integrated in the component has a different characteristic, e.g. degradation, from the regulator under the burn-in voltage after the burn-in test duration. The element may be a fuse.
申请公布号 DE59914589(D1) 申请公布日期 2008.02.07
申请号 DE1999514589 申请日期 1999.11.11
申请人 INFINEON TECHNOLOGIES AG 发明人 WIRTH, NORBERT;CORDES, ERIC;MANYOKI, ZOLTAN;SAVIGNAC, DOMINIQUE DR.
分类号 G01R31/316;G01R31/28 主分类号 G01R31/316
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