SEMICONDUCTOR DEVICE, METHOD FOR CONTROLLING SEMICONDUCTOR DEVICE, AND METHOD FOR CREATING CONTROL INFORMATION OF SEMICONDUCTOR DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a method for highly precisely creating the control information of a semiconductor device corresponding to the variation characteristic distribution of a process parameter while suppressing increases in time and cost. SOLUTION: A semiconductor device 2 has a plurality of elements. It also has an F-V table storage part 31 for low voltage threshold cells for storing an F-V table TB11 of an oscillation frequency f1 depending on the plurality of elements and a power supply voltage EV to be supplied to the plurality of elements. It has a process sensor block 12 including at least one of the plurality of elements, for monitoring the oscillation frequency f1 depending on at least one element. It further has a selector 33 for selecting the power supply voltage EV associated with the oscillation frequency f1 according to the F-V table TB11, and sets it as the supply voltage to be supplied to the semiconductor device 2. The F-V table TB11 is obtained by mutually associating the combinations of random number modelsξn between an F-ξtable TB20 and anξ-V table TB30. COPYRIGHT: (C)2009,JPO&INPIT