发明名称 Method for selectively stressing MOSFETs to improve charge carrier mobility
摘要 A strained channel MOSFET device with improved charge mobility and method for forming the same, the method including providing a first gate with a first semiconductor conductive type and second gate with a semiconductor conductive type on a substrate; forming a first strained layer with a first type of stress on said first gate; and, forming a second strained layer with a second type of stress on said second gate.
申请公布号 US2006223255(A1) 申请公布日期 2006.10.05
申请号 US20060370397 申请日期 2006.03.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHEN CHIEN-HAO;CHEN CHIA-LIN;HSU JU-WANG;LEE TZE-LIANG;CHEN SHIH-CHANG
分类号 H01L21/8238;H01L29/76 主分类号 H01L21/8238
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