发明名称 |
SEMICONDUCTOR DEVICE MULTILAYER STRUCTURE, FABRICATION METHOD FOR THE SAME, SEMICONDUCTOR DEVICE HAVING THE SAME, AND SEMICONDUCTOR DEVICE FABRICATION METHOD |
摘要 |
In one embodiment, a semiconductor device comprises a semiconductor substrate and a doped conductive layer formed over the semiconductor substrate. A diffusion barrier layer is formed over the doped conductive layer. The diffusion barrier layer comprises an amorphous semiconductor material. After forming the diffusion barrier layer, a heat treatment process may be additionally performed thereon. An ohmic contact layer is formed over the diffusion barrier layer. A metal barrier layer is formed over the ohmic contact layer. A metal layer is formed over the metal barrier layer.
|
申请公布号 |
US2006223252(A1) |
申请公布日期 |
2006.10.05 |
申请号 |
US20060379350 |
申请日期 |
2006.04.19 |
申请人 |
|
发明人 |
PARK JAE-HWA;LEE JANG-HEE;KIM DAE-YONG;PARK HEE-SOOK |
分类号 |
H01L21/8234 |
主分类号 |
H01L21/8234 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|