发明名称 SEMICONDUCTOR DEVICE MULTILAYER STRUCTURE, FABRICATION METHOD FOR THE SAME, SEMICONDUCTOR DEVICE HAVING THE SAME, AND SEMICONDUCTOR DEVICE FABRICATION METHOD
摘要 In one embodiment, a semiconductor device comprises a semiconductor substrate and a doped conductive layer formed over the semiconductor substrate. A diffusion barrier layer is formed over the doped conductive layer. The diffusion barrier layer comprises an amorphous semiconductor material. After forming the diffusion barrier layer, a heat treatment process may be additionally performed thereon. An ohmic contact layer is formed over the diffusion barrier layer. A metal barrier layer is formed over the ohmic contact layer. A metal layer is formed over the metal barrier layer.
申请公布号 US2006223252(A1) 申请公布日期 2006.10.05
申请号 US20060379350 申请日期 2006.04.19
申请人 发明人 PARK JAE-HWA;LEE JANG-HEE;KIM DAE-YONG;PARK HEE-SOOK
分类号 H01L21/8234 主分类号 H01L21/8234
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