SEMICONDUCTOR DEVICE APPLICATION TEST APPARATUS CAPABLE OF TESTING MANY SEMICONDUCTOR DEVICES SIMULTANEOUSLY

摘要

A semiconductor device application test apparatus for testing simultaneously a plurality of semiconductor devices are provided to reduce a mounting test cost and a test time by testing simultaneously a plurality of DUTs(Device Under Tests) on one system board. A system part(210) removes only a test target semiconductor device from an electronic device. An interface part(230) is electrically connected with a removed portion and includes a reference semiconductor device(233). The interface part further includes a first control portion(235) for controlling a transmission operation for transmitting an operational signal to a plurality of DUTs between the reference semiconductor device and the system part. A test part(250) receives the operational signal and transmits the operational signal to one or more DUTs of the DUTs. The test part includes one or more second control portions(254a,254b) for evaluating operations of one or more DUTs. A socket part(270) includes a plurality of test sockets(275a,275b) in order to transmit the operational signals of the second control portions to the DUTs or to transmit signals of the DUTs to the second control portions.