发明名称 METHOD OF FORMING A BICMOS SEMICONDUCTOR CHIP THAT INCREASES THE BETAS OF THE BIPOLAR TRANSISTORS
摘要 The betas of the bipolar transistors in a BiCMOS semiconductor structure are increased by forming the emitters of the bipolar transistors with two implants: a source-drain implant that forms a first emitter region at the same time that the source and drain regions are formed, and an additional implant that forms a second emitter region at the same time that another region is formed. The additional implant has an implant energy that is greater than the implant energy of the source-drain implant.
申请公布号 US2016163598(A1) 申请公布日期 2016.06.09
申请号 US201414561008 申请日期 2014.12.04
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 Lavrovskaya Natalia;Sadovnikov Alexei;Strachan Andrew D.
分类号 H01L21/8249;H01L29/40;H01L21/265;H01L21/8238;H01L29/10;H01L29/08;H01L29/66;H01L29/06 主分类号 H01L21/8249
代理机构 代理人
主权项 1. A method of forming a BiCMOS semiconductor structure, the method comprising: simultaneously forming a shallow base n-well of an pnp bipolar transistor structure, a shallow emitter n-well of an npn bipolar transistor structure, and a shallow body n-well of a PMOS transistor structure in a semiconductor material; and simultaneously forming an n+ source region and an n+ drain region of an NMOS transistor structure, and an n+ emitter region of the npn bipolar transistor structure in the semiconductor material, the n+ emitter region touching the shallow emitter n-well.
地址 Dallas TX US