发明名称 |
METHOD OF FORMING A BICMOS SEMICONDUCTOR CHIP THAT INCREASES THE BETAS OF THE BIPOLAR TRANSISTORS |
摘要 |
The betas of the bipolar transistors in a BiCMOS semiconductor structure are increased by forming the emitters of the bipolar transistors with two implants: a source-drain implant that forms a first emitter region at the same time that the source and drain regions are formed, and an additional implant that forms a second emitter region at the same time that another region is formed. The additional implant has an implant energy that is greater than the implant energy of the source-drain implant. |
申请公布号 |
US2016163598(A1) |
申请公布日期 |
2016.06.09 |
申请号 |
US201414561008 |
申请日期 |
2014.12.04 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
Lavrovskaya Natalia;Sadovnikov Alexei;Strachan Andrew D. |
分类号 |
H01L21/8249;H01L29/40;H01L21/265;H01L21/8238;H01L29/10;H01L29/08;H01L29/66;H01L29/06 |
主分类号 |
H01L21/8249 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a BiCMOS semiconductor structure, the method comprising:
simultaneously forming a shallow base n-well of an pnp bipolar transistor structure, a shallow emitter n-well of an npn bipolar transistor structure, and a shallow body n-well of a PMOS transistor structure in a semiconductor material; and simultaneously forming an n+ source region and an n+ drain region of an NMOS transistor structure, and an n+ emitter region of the npn bipolar transistor structure in the semiconductor material, the n+ emitter region touching the shallow emitter n-well. |
地址 |
Dallas TX US |