发明名称 INFRARED RADIATION RATIO MEASUREMENT DEVICE AND INFRARED RADIATION RATIO MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a compact and lightweight infrared radiation ratio measurement device with a simple structure.SOLUTION: An infrared radiation ratio measurement device includes three infrared sensors 2 which measure different wavelengths (a first infrared sensor, a second infrared sensor, and a third infrared sensor); a storage unit 15, and a calculation unit 16. The storage unit 15 stores the relation between the surface temperature of the measurement target and the gradient of the infrared intensity with respect to the wavelength difference from the first infrared sensor and the second infrared sensor. The calculation unit 16 obtains the surface temperature from the relation between the surface temperature of the measurement target and the gradient of the stored infrared intensity on the basis of the gradient of the infrared intensity with respect to the wavelength difference from the first infrared sensor and the second infrared sensor. The calculation unit 16 calculates the total radiation energy E of the measurement target from the output signals of the third infrared sensor. The calculation unit 16 calculates the total energy Eb of the full radiator from the surface temperature of the measurement target and calculates the radiation ratio (E/Eb) of the measurement target.SELECTED DRAWING: Figure 1
申请公布号 JP2016180690(A) 申请公布日期 2016.10.13
申请号 JP20150061134 申请日期 2015.03.24
申请人 JAPAN ATOMIC ENERGY AGENCY 发明人 OTAKA MASAHIKO;CHIKASAWA YOSHITAKA;KATO ATSUSHI
分类号 G01J5/00;G01J5/48;G01J5/60 主分类号 G01J5/00
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