发明名称 ELECTRON DEVICE, AND ITS MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of reducing a stress generated by a thermal expansion difference, wherein it is necessary to perform a lower tensional packaging in order to bond an LSI chip to a packaging circuit board and a bonding becomes possible at a low temperature of 100&deg;C or less, preferably at a low temperature of 30&deg;C or less by using a conductor in which there are dispersed metallic particles forming an alloy with Ga at 100&deg;C or less in a metal containing Ga at the time of a solder bonding. <P>SOLUTION: A distance between an electrode 2 provided in electron devices 1 and an electrode 4 provided in a packaging board 3 is bonded by a conductor 5 in which there are dispersed metallic particles 7 responding to the alloy with Ga at 100&deg;C or less in a metal 6 containing Ga. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007242900(A) 申请公布日期 2007.09.20
申请号 JP20060063543 申请日期 2006.03.09
申请人 FUJITSU LTD 发明人 ABE TOMOYUKI
分类号 H01L21/60 主分类号 H01L21/60
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