发明名称 |
RADIATION DETECTION DEVICE, RADIATION DETECTION METHOD, AND COMPUTER PROGRAM PRODUCT |
摘要 |
According to an embodiment, a radiation detection device includes a scintillator layer, a plurality of detectors, a setting unit, an identifier, and a corrector. The scintillator layer is configured to convert radiation into scintillation light. The detectors are arranged along a first surface facing the scintillator layer to detect light. The setting unit is configured to set one of the detectors as a first detector to be corrected. The identifier is configured to identify, out of the detectors, a second detector that detects a synchronization signal synchronizing with a first signal detected by the first detector. The corrector is configured to correct an energy spectrum of light detected by the first detector on the basis of a second signal serving as the synchronization signal in signals detected by the second detector, the first signal, and characteristic X-ray energy of a scintillator raw material constituting the scintillator layer. |
申请公布号 |
US2016231441(A1) |
申请公布日期 |
2016.08.11 |
申请号 |
US201514963805 |
申请日期 |
2015.12.09 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
FUJII Keiko;KAWATA Go;HOSONO Yasuharu;MIYAZAKI Kazunori;HASEGAWA Rei |
分类号 |
G01T7/00;G01T1/36 |
主分类号 |
G01T7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A radiation detection device, comprising:
a scintillator layer configured to convert radiation into scintillation light; a plurality of detectors arranged along a first surface facing the scintillator layer to detect light; a setting unit configured to set one of the detectors as a first detector to be corrected; an identifier configured to identify, out of the detectors, a second detector that detects a synchronization signal synchronizing with a first signal detected by the first detector; and a corrector configured to correct an energy spectrum of light detected by the first detector on the basis of a second signal serving as the synchronization signal in signals detected by the second detector, the first signal, and characteristic X-ray energy of a scintillator raw material constituting the scintillator layer. |
地址 |
Tokyo JP |