发明名称 |
SEMICONDUCTOR STRUCTURE WITH EXTENDING GATE STRUCTURE AND METHOD FOR FORMING THE SAME |
摘要 |
A semiconductor structure and a method for forming the same are provided. The semiconductor structure includes a substrate and a fin structure formed over the substrate. The semiconductor structure further includes an isolation structure formed around the fin structure and a gate structure formed across the fin structure. In addition, the gate structure includes a first portion formed over the fin structure and a second portion formed over the isolation structure, and the second portion of the gate structure includes an extending portion extending into the isolation structure. |
申请公布号 |
US2016240650(A1) |
申请公布日期 |
2016.08.18 |
申请号 |
US201514621805 |
申请日期 |
2015.02.13 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd |
发明人 |
CHANG Che-Cheng;LIN Chih-Han |
分类号 |
H01L29/78;H01L29/423;H01L29/40;H01L29/06;H01L29/66 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor structure, comprising:
a substrate; a fin structure formed over the substrate; an isolation structure formed around the fin structure; a gate structure formed across the fin structure; and a spacer formed on a sidewall of the second portion of the gate structure, wherein: the gate structure comprises a first portion formed over the fin structure and a second portion formed over the isolation structure, and the second portion of the gate structure comprises an extending portion extending into the isolation structure, and a dielectric layer is disposed between the spacer and the isolation structure. |
地址 |
Hsin-Chu TW |