发明名称 SUBSTRATE DETECTING DEVICE AND BULGE HEIGHT DETECTING METHOD
摘要 A substrate detecting device and a bulge height detecting method. The substrate detecting device comprises: a bearing platform (2) for bearing a to-be-detected substrate (1), and a sensor support (3), one end of the sensor support (3) being provided with a height measuring sensor (4), wherein the height measuring sensor (4) is of a cone structure, and the diameter of one end face of the height measuring sensor (4) for detecting the to-be-detected substrate (1) is smaller than that of the other end face thereof. The substrate detecting device and the bulge height detecting method can solve the problem of inaccuracy in the measurement of flaw height of a bulge on a color film substrate and in the calculation of the flaw height.
申请公布号 WO2016155190(A1) 申请公布日期 2016.10.06
申请号 WO2015CN86752 申请日期 2015.08.12
申请人 BOE TECHNOLOGY GROUP CO., LTD.;HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. 发明人 LIU, Guilin;LI, Jingjing;CUI, Xiujuan;LI, Juan;ZHANG, Hongyan;YU, Shanshan
分类号 G02F1/13;G01B21/02 主分类号 G02F1/13
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