发明名称 DEPOSITING METHOD AND DEPOSITING DEVICE FOR SILICON OXIDE FILM
摘要 PROBLEM TO BE SOLVED: To provide a depositing method and a depositing device, which are capable of forming a silicon oxide film high in insulating property. SOLUTION: In a first reaction chamber 1, alkyl siloxane compound 5 and ozone are mixed at a temperature lower than a temperature whereat the alkyl siloxane compound and ozone form the silicon oxide film through thermal reaction degradation, and a first temperature whereat the precursor substance of the silicon oxide film is produced to obtain reactant gas containing the precursor substance while a substrate 6, on which the silicon oxide film is to be formed, is disposed in a second reaction chamber 2. Then the temperature of the reactant gas is controlled so as to be a second temperature, higher than a temperature whereat the alkyl siloxane compound and ozone form the silicon oxide film through thermal reaction degradation to form the silicon oxide film on the substrate. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007220981(A) 申请公布日期 2007.08.30
申请号 JP20060041184 申请日期 2006.02.17
申请人 MITSUBISHI ELECTRIC CORP;HOTTA SUSUMU 发明人 NODA SEIJI;NAKAI TAKAFUMI;HOTTA SUSUMU
分类号 H01L21/316;H01L21/31 主分类号 H01L21/316
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