发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which prevents a degradation of characteristics due to a facet. SOLUTION: The semiconductor device comprises an element isolation region 12; a semiconductor element region 11 which is prescribed by the element isolation region 12, and has a channel forming part 11a and a recess formed between the element isolation region 12 and the channel forming part 11a; and an epitaxial semiconductor 19 formed in the recess. The semiconductor element region 11 has a wall 11b between the element isolation region 12 and the epitaxial semiconductor 19. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007220808(A) 申请公布日期 2007.08.30
申请号 JP20060038249 申请日期 2006.02.15
申请人 TOSHIBA CORP 发明人 YAMAZAKI HIROYUKI;MATSUO KOJI;IWASA SEIICHI
分类号 H01L29/78;H01L21/28;H01L21/8238;H01L27/092;H01L29/786 主分类号 H01L29/78
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