发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which prevents a degradation of characteristics due to a facet. SOLUTION: The semiconductor device comprises an element isolation region 12; a semiconductor element region 11 which is prescribed by the element isolation region 12, and has a channel forming part 11a and a recess formed between the element isolation region 12 and the channel forming part 11a; and an epitaxial semiconductor 19 formed in the recess. The semiconductor element region 11 has a wall 11b between the element isolation region 12 and the epitaxial semiconductor 19. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007220808(A) |
申请公布日期 |
2007.08.30 |
申请号 |
JP20060038249 |
申请日期 |
2006.02.15 |
申请人 |
TOSHIBA CORP |
发明人 |
YAMAZAKI HIROYUKI;MATSUO KOJI;IWASA SEIICHI |
分类号 |
H01L29/78;H01L21/28;H01L21/8238;H01L27/092;H01L29/786 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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