发明名称 |
PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD OF CURED RELIEF PATTERN, SEMICONDUCTOR DEVICE, AND DISPLAY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a photosensitive resin composition which suppresses a residue after development and which is curable at a low temperature and excellent in tensile elongation of a cured film after cured, and to provide a cured film using the photosensitive resin composition, a cured relief pattern forming a pattern and a production method of the relief pattern, and a semiconductor device and a display device having the cured relief pattern.SOLUTION: The photosensitive resin composition comprises the following components (A) to (C). They are: (A) 100 pts.mass of a phenol resin; (B) 0.01 to 20 pts.mass of at least one carboxylic acid or a derivative thereof, selected from the group consisting of monocarboxylic acid compounds having an unsaturated bond and having 3 to 35 carbon atoms and carboxylic acid ester compounds having an unsaturated bond and having 4 to 100 carbon atoms; and (C) 0.1 to 20 pts.mass of a photoacid generator. |
申请公布号 |
JP2014186124(A) |
申请公布日期 |
2014.10.02 |
申请号 |
JP20130060161 |
申请日期 |
2013.03.22 |
申请人 |
ASAHI KASEI E-MATERIALS CORP |
发明人 |
OKUDA TOSHIAKI;SASAKI TAKAHIRO |
分类号 |
G03F7/004;C08K5/09;C08K5/10;C08L61/06;C08L91/00;G03F7/023;G03F7/038 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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