发明名称 METHOD FOR FORMING METAL LINE IN SEMICONDUCTOR DEVICE
摘要 A method for forming a metal line in a semiconductor device is provided to prevent the generation of voids on an interface between the metal line and a contact plug by enhancing a coating characteristic of the metal line. An insulating layer for exposing a part of a first conductive layer(110) through a contact hole is formed on a substrate. A contact plug(115) is formed in the inside of the contact hole in order to expose a part of an inner sidewall of the contact hole. An opening(117) of the contact hole is enlarged by etching a part of the insulating layer. A second conductive layer connected with the contact plug is deposited to bury the contact hole.
申请公布号 KR20060131399(A) 申请公布日期 2006.12.20
申请号 KR20050051826 申请日期 2005.06.16
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SUNG KWON;JUNG, TAE WOO
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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