发明名称 |
METHOD FOR FORMING METAL LINE IN SEMICONDUCTOR DEVICE |
摘要 |
A method for forming a metal line in a semiconductor device is provided to prevent the generation of voids on an interface between the metal line and a contact plug by enhancing a coating characteristic of the metal line. An insulating layer for exposing a part of a first conductive layer(110) through a contact hole is formed on a substrate. A contact plug(115) is formed in the inside of the contact hole in order to expose a part of an inner sidewall of the contact hole. An opening(117) of the contact hole is enlarged by etching a part of the insulating layer. A second conductive layer connected with the contact plug is deposited to bury the contact hole.
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申请公布号 |
KR20060131399(A) |
申请公布日期 |
2006.12.20 |
申请号 |
KR20050051826 |
申请日期 |
2005.06.16 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SUNG KWON;JUNG, TAE WOO |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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