| 摘要 |
The invention relates to method and apparatus for production of gaseous ions from components of a condensed phase sample and analysis thereof, wherein one or more liquid jet(s) is/are directed to the surface of the sample to be investigated, where the impact of the liquid jet on the sample surface produces droplets carrying sample particles which are turned into gaseous ions via the evaporation of liquid or, if desired, by a subsequent ionization after the evaporation and the obtained sample particles are analyzed by a known method. |
