发明名称 METHOD FOR WET ETCHING OF SILICON WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method for wet etching of a silicon wafer, by which a damage-less silicon wafer can be obtained without causing the generation of NOx gas as happened in wet etching with a mixed acid solution.SOLUTION: A method for wet etching of a silicon wafer comprises the steps of: using a chemical solution containing polyoxometalate which reversibly performs a redox reaction and hydrofluoric acid for etching the silicon wafer 2; recovering the post-etching chemical solution; separating the polyoxometalate from the chemical solution; and performing an oxidation process on the reduced polyoxometalate for reuse for etching.SELECTED DRAWING: Figure 1
申请公布号 JP2016213337(A) 申请公布日期 2016.12.15
申请号 JP20150096231 申请日期 2015.05.11
申请人 ACE:KK 发明人 YOSHIKAWA KAZUHIRO
分类号 H01L21/308;H01L21/304 主分类号 H01L21/308
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