发明名称 INTEGRATED CIRCUIT TRENCHED FEATURES AND METHOD OF PRODUCING SAME
摘要 <p>The formation of microelectronic structures in trenches and vias of an integrated circuit wafer are described using nanocrystal solutions. A nanocrystal solution is applied to flood the wafer surface. The solvent penetrates the trench recesses within the wafer surface. In the process, nanocrystals dissolved or suspended in the solution are carried into these regions. The solvent volatilizes more quickly from the wafer plateaus as compared to the recesses causing the nanocrystals to become concentrated in the shrinking solvent pools within the recesses. The nanocrystals become stranded in the dry trenches. Heating the wafer to a temperature sufficient to sinter or melt the nanocrystals results in the formation of bulk polycrystalline domains. Heating is also carried out concurrently with nanocrystals solution deposition. Copper nanocrystals of less than about 5 nanometers are particularly well suited for formation of interconnects at temperatures of less than 350 degrees Celcius.</p>
申请公布号 WO0010197(A1) 申请公布日期 2000.02.24
申请号 WO1999US18430 申请日期 1999.08.13
申请人 GOLDSTEIN, AVERY, N. 发明人 GOLDSTEIN, AVERY, N.
分类号 H01L21/283;H01L21/288;H01L21/3205;H01L21/768;H01L23/52;H01L23/532;(IPC1-7):H01L21/20;H01L23/48;H01L21/44 主分类号 H01L21/283
代理机构 代理人
主权项
地址