发明名称 FLASH MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>PURPOSE: A flash memory device and a manufacturing method thereof are provided to reduce capacitance due to the top part of a conductive layer and a control gate by making a distance between control gates more distant than a distance between floating gates of a memory cell. CONSTITUTION: A plurality of memory cells(M0-Mn), source and drain select transistors(SST,DST) are included. Memory cells includes a floating gate(220a), a dielectric film(230) and control gates(240a) laminated successively. The source and drain select transistors includes a first conductive layer(220) and a second conductive layer(240) laminated successively.</p>
申请公布号 KR20100013966(A) 申请公布日期 2010.02.10
申请号 KR20080075730 申请日期 2008.08.01
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, DONG HWAN
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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