发明名称 |
Semiconductor Structure with Inhomogeneous Regions |
摘要 |
A semiconductor layer including a plurality of inhomogeneous regions is provided. Each inhomogeneous region has one or more attributes that differ from a material forming the semiconductor layer. The inhomogeneous regions can include one or more regions configured based on radiation having a target wavelength. These regions can include transparent and/or reflective regions. The inhomogeneous regions also can include one or more regions having a higher conductivity than a conductivity of the radiation-based regions, e.g., at least ten percent higher. In one embodiment, the semiconductor layer is used to form an optoelectronic device. |
申请公布号 |
US2016336483(A1) |
申请公布日期 |
2016.11.17 |
申请号 |
US201615225403 |
申请日期 |
2016.08.01 |
申请人 |
Sensor Electronic Technology, Inc. |
发明人 |
Shatalov Maxim S.;Dobrinsky Alexander;Jain Rakesh;Shur Michael |
分类号 |
H01L33/10;H01L33/20;H01L33/06;H01L33/32;H01L33/00 |
主分类号 |
H01L33/10 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor heterostructure, comprising:
an active region configured to at least one of: emit or sense, target radiation having a target wavelength; a contact; and a group III nitride semiconductor layer located between the active region and the contact, the group III semiconductor layer including a plurality of inhomogeneous regions arranged within multiple levels of the semiconductor layer, each having a set of attributes differing from a group III nitride material forming the group III semiconductor layer, wherein the plurality of inhomogeneous regions include at least one reflective region and at least one conductive region. |
地址 |
Columbia SC US |