发明名称 Semiconductor Structure with Inhomogeneous Regions
摘要 A semiconductor layer including a plurality of inhomogeneous regions is provided. Each inhomogeneous region has one or more attributes that differ from a material forming the semiconductor layer. The inhomogeneous regions can include one or more regions configured based on radiation having a target wavelength. These regions can include transparent and/or reflective regions. The inhomogeneous regions also can include one or more regions having a higher conductivity than a conductivity of the radiation-based regions, e.g., at least ten percent higher. In one embodiment, the semiconductor layer is used to form an optoelectronic device.
申请公布号 US2016336483(A1) 申请公布日期 2016.11.17
申请号 US201615225403 申请日期 2016.08.01
申请人 Sensor Electronic Technology, Inc. 发明人 Shatalov Maxim S.;Dobrinsky Alexander;Jain Rakesh;Shur Michael
分类号 H01L33/10;H01L33/20;H01L33/06;H01L33/32;H01L33/00 主分类号 H01L33/10
代理机构 代理人
主权项 1. A semiconductor heterostructure, comprising: an active region configured to at least one of: emit or sense, target radiation having a target wavelength; a contact; and a group III nitride semiconductor layer located between the active region and the contact, the group III semiconductor layer including a plurality of inhomogeneous regions arranged within multiple levels of the semiconductor layer, each having a set of attributes differing from a group III nitride material forming the group III semiconductor layer, wherein the plurality of inhomogeneous regions include at least one reflective region and at least one conductive region.
地址 Columbia SC US